The fluctuation conductivity (FC) and pseudogap (PG) in Y1-xPrxBa2Cu3O7-y with x approximate to 0.1 are investigated. It is shown that the temperature dependence of the FC is the same as in YBa2Cu3O7-y containing defects. At the same time, the temperature dependence of the PG differs from the analogous dependence obtained for YBa2Cu3O7-y films. An increase of the coherence length and decrease of the characteristic temperature T-* in Y1-xPrxBa2Cu3O7-y is observed with increasing Pr concentration.
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