Laser scanning microscopy of HTS films and devices (Review Article)

The capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high-T-c superconductivity (HTS) materials and devices are described. The earlier results obtained by the authors are briefly reviewed. Some novel applications of LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, and development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.