期刊
ADVANCED MATERIALS
卷 18, 期 11, 页码 1377-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200501231
关键词
-
Conductive atomic force microscope (AFM) nanopatterning on hydrogen-terminated silicon in a hydrophobic organic solvent under ambient conditions produces features consistent with AFM field-induced oxidation. The growth rate of the oxide features (see figure) exhibits modulation consistent with a space-charge-limited growth mechanism.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据