期刊
ANALYTICA CHIMICA ACTA
卷 570, 期 1, 页码 34-40出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.aca.2006.03.111
关键词
imaging techniques; time-of-flight secondary ion mass spectrometry (ToF-SIMS); scanning electron microscopy with energy dispersive X-ray analysis; (SEM-EDX); Fourier transform infrared microscopy (FTIR microscopy); cultural heritage; African art
Chemical imaging techniques, based on the combination of microscopy and spectroscopy, are well suited to study both the composition and the spatial organization of heterogeneous complex mixtures of organic and mineral matter. Time-of-flight secondary ion mass spectrometry (ToF-SIMS), followed by scanning electron microscopy with energy dispersive X-ray analysis (SEM-EDX) and Fourier transform infrared microscopy (FTIR microscopy) have been applied to non-destructive analysis of micro-samplings of ritual matters deposited on the surface of African wooden statuettes. With a very careful preparation, using ultramicrotomy on embedded samples, it was possible to perform successively all the measurements on a single fragment. Comparison and superposition of the different chemical images, obtained on a sample from a significant actual artefact, have allowed us to identify minerals (clays, quartz and calcium carbonate), proteins, starch, urate salts and lipids and to map their spatial distribution. (c) 2006 Elsevier B.V. All rights reserved.
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