期刊
SURFACE SCIENCE
卷 600, 期 12, 页码 2411-2416出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2006.03.030
关键词
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Nano-sized P4P (para-quaterphenytene) organic crystallites grown on a gold substrate were removed and redeposited using the tip of an STM. The controlled lift-off of the needle-shaped crystallites was imaged by a simultaneously operated SEM. The forces exerted by the metal STM tip on the nano-crystal during this nano-manipulation process could be determined by monitoring the deflection of the STM tip. After the lift-off process the former contact area was imaged using the STM. These STM micrographs clearly demonstrate that the region between the needles is covered by a P4P layer with a thickness of at least 3 nm. (c) 2006 Elsevier B.V. All rights reserved.
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