Quantitative Rietveld texture analysis of CaSiO3 perovskite deformed in a diamond anvil cell

The Rietveld method is used to extract quantitative texture information from a single synchrotron diffraction image of a CaSiO3 perovskite sample deformed in axial compression in a diamond anvil cell. The image used for analysis was taken in radial geometry at 49 GPa and room temperature. We obtain a preferred orientation of {100} lattice planes oriented perpendicular to the compression direction and this is compatible with {110}< 1(1) over bar 0 > slip.