期刊
JOURNAL OF PHYSICS-CONDENSED MATTER
卷 18, 期 25, 页码 S995-S1005出版社
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/18/25/S07
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The Rietveld method is used to extract quantitative texture information from a single synchrotron diffraction image of a CaSiO3 perovskite sample deformed in axial compression in a diamond anvil cell. The image used for analysis was taken in radial geometry at 49 GPa and room temperature. We obtain a preferred orientation of {100} lattice planes oriented perpendicular to the compression direction and this is compatible with {110}< 1(1) over bar 0 > slip.
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