期刊
MEASUREMENT SCIENCE AND TECHNOLOGY
卷 17, 期 7, 页码 1941-1946出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-0233/17/7/036
关键词
avalanche photodiodes; excess noise factor; transimpedance amplifier; phase-sensitive detection
We report a versatile system for measuring excess noise and multiplication in avalanche photodiodes, using a transimpedance amplifier front-end and based on phase-sensitive detection, which permits accurate measurement in the presence of a high dark current. The system, which we have used successfully on a wide variety of materials and device structures, can measure reliably the excess noise factor of devices with a capacitance of up to similar to 50 pF.
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