期刊
THIN SOLID FILMS
卷 510, 期 1-2, 页码 95-101出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2005.12.265
关键词
zinc oxide; indium tin oxide; ellipsometry; conductivity; optical constants
The refractive indices of textured indium tin oxide (ITO) and zinc oxide (ZnO) thin films were measured and compared. The ITO thin film brown on g-lass and ZnO buffered glass substrates by sputtering showed distinct differences; the refractive index of ITO on glass was about 0.05 higher than that of ITO on ZnO buffered glass in the whole visible spectrum. The ZnO thin film grown on glass and ITO buffered glass substrates by filtered vacuum arc also showed distinct differences; the refractive index of ZnO on glass was higher than that of ZnO on ITO buffered glass in the red and green region, but lower in the blue region. The largest refractive index difference of ZnO on glass and ITO buffered glass was about 0.1 in the visible spectrum. The refractive index variation was correlated with the crystal quality, surface morphology and conductivity of the thin films.(c) 2005 Elsevier B.V. All rights reserved.
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