Intrinsic ferroelectric properties of strained tetragonal PbZr0.2Ti0.8O3 obtained on layer-by-layer grown, defect-free single-crystalline films

Ferroelectric single-crystalline PbZr0.2Ti0.8O3 thin films, free from extended defects, are grown by pulsed laser deposition onto vicinal SrTiO3(001) single crystals. The PbZr0.2Ti0.8O3 films are strained and exhibit enhanced tetragonality, c/a approximate to 1.06. They have a remnant polarization, P-r = 110 mu C cm(-2), dielectric constant, 633 = 90, and piezoelectric coefficient, d(33), up to 50 pm V-1 (see figure).