4.7 Article

Critical managerial factors affecting defense projects success: A comparison between neural network and regression analysis

期刊

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.engappai.2005.12.002

关键词

defense development projects; managerial success factors; neural networks

向作者/读者索取更多资源

A comparison between neural networks and linear regression analysis is used for identifying critical managerial factors affecting the success of high-tech defense projects. The study shows that neural networks have better explanatory and prediction power, and it enables the exploration of relationships among the data that are difficult to arrive at by traditional statistical methods. The study yielded some new results: The chances to success of a project that was acknowledged by its prospected customers as essential for improving their performance are much higher than other projects. Furthermore, organizational learning and social cohesion of the development team are of extreme importance for success. (c) 2006 Elsevier Ltd. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据