期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 39, 期 -, 页码 509-518出版社
BLACKWELL PUBLISHING
DOI: 10.1107/S0021889806019546
关键词
-
A correlated Gaussian lattice-parameter distribution of an ensemble of crystals, as leading to line broadening in the course of powder diffraction, can be associated with a correlated Gaussian microstrain distribution. The latter can be described in terms of a fourth-rank covariance tensor containing as its 81 components E-ijpq, the variances and the covariances of the nine components epsilon(ij) of the symmetric second-rank strain tensor ( formulated with respect to Cartesian coordinates), i.e. E-ijpq = [epsilon(ij)epsilon(pq)]. The restrictions for the E-ijpq tensor components resulting from assumed crystal class-symmetry invariance are the same as expected for certain fourth-rank property tensors, like compliancy. The parametrization of anisotropic microstrain broadening ( e.g. in the course of Rietveld refinement) on the basis of the covariance tensor components E-ijpq has, in comparison with earlier approaches, the advantage of straightforward recognizability of the case of isotropic microstrain broadening, independently of the actual crystallographic coordinate system.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据