Degradation mechanism of organic light-emitting device investigated by scanning photoelectron microscopy coupled with peel-off technique

The authors present space-resolved spectroscopic data on organic layers of a degraded organic light-emitting device. The data were obtained using a scanning photoelectron microscope (SPEM) coupled with peel-off technique to directly probe the uncontaminated organic layers, which were covered with cathode layer. The SPEM images of the degraded device show different and small size distributions of tris-8-hydroxy quinoline aluminum (Alq(3)) and hole-transport layers compared to that of as-prepared device. The analysis indicates that bonding strength between Alq(3) and cathode layers and between the Alq(3) and hole transport layers becomes weak as the device degrades, presumably due to structural deformation of the organic layers. (c) 2006 American Institute of Physics.