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X-ray microprobe of orbital alignment in strong-field ionized atoms

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PHYSICAL REVIEW LETTERS
卷 97, 期 8, 页码 -

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AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.97.083601

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We have developed a synchrotron-based, time-resolved x-ray microprobe to investigate optical strong-field processes at intermediate intensities (10(14)-10(15) W/cm(2)). This quantum-state specific probe has enabled the direct observation of orbital alignment in the residual ion produced by strong-field ionization of krypton atoms via resonant, polarized x-ray absorption. We found strong alignment to persist for a period long compared to the spin-orbit coupling time scale (6.2 fs). The observed degree of alignment can be explained by models that incorporate spin-orbit coupling. The methodology is applicable to a wide range of problems.

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