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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
卷 23, 期 9, 页码 1954-1964出版社
OPTICAL SOC AMER
DOI: 10.1364/JOSAB.23.001954
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A simple and robust setup for femtosecond time-resolved imaging interferometry of surfaces is described. The apparatus is capable of measuring both very small phase shifts (similar to 3 x 10(-2) rad) and amplitude changes (similar to 1%) with micrometer spatial resolution (similar to 1 mu m). Interferograms are processed using a 2D-Fourier transform algorithm. We discuss the image formation and the physical interpretation of the measured interferograms. The technique is applied to measure transient changes of a GaAs surface irradiated with intense femtosecond laser pulses with fluences near the ablation threshold. (c) 2006 Optical Society of America.
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