期刊
JOURNAL OF ANALYTICAL CHEMISTRY
卷 61, 期 9, 页码 883-888出版社
MAIK NAUKA/INTERPERIODICA/SPRINGER
DOI: 10.1134/S1061934806090085
关键词
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A procedure was proposed for the gas-chromatographic determination of impurity organic compounds in high-purity dichlorosilane with a detection limit of 0.1-0.2 ppm, which allows metrological control in the production of high-purity dichlorosilane according to the current requirements of microelectronics.
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