3.8 Article

Hermetic packaging using eutectic SnPb solder and Cr/Ni/Cu metallurgy layer

期刊

IEEE TRANSACTIONS ON ADVANCED PACKAGING
卷 29, 期 4, 页码 760-765

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TADVP.2006.879427

关键词

flux-free; hermetic packaging; integrated circuit packaging; semiconductor device packaging; soldering; thin-film circuit packaging

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We have developed an easy, low-cost, and low-temperature optoelectronic hermetic packaging technology utilizing the eutectic SnPb solder and the Cr/Ni/Cu bonding pad. Bonding characteristics of the design were investigated in three different setups: silicon-silicon, silicon-glass, and glass-glass samples. Hermeticity was achieved at 200 degrees C without flux for all samples during the final bonding process. The bonding pads did not dewet during or after the reflow process. By utilizing the eutectic SnPb solder, the self-alignment process can be achieved. Because the bonding process was conducted through visual alignment, original misalignment was estimated to be more than 100 mu m. The surface tension of melting solder during the reflow process allowed the samples to self-align and obtain a misalignment of less than 20 mu m after solidification, which was 4% of the entire solder width. The bonding strength of the three setups ranged from 3 to 10 MPa. Among the three setups, glass-glass samples appear to have the strongest bonding strength. This low-temperature and cost-effective soldering process has demonstrated its feasibility and potential utilization in optoelectronic packaging.

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