Dislocation-free m-plane InGaN/GaN light-emitting diodes on m-plane GaN single crystals

m-Plane (1010) nonpolar InGaN-based light emitting diodes (LEDs) with no threading dislocations or stacking faults have been realized on in-plane GaN single crystals by conventional metal organic vapor phase epitaxy. The crystalline properties of the material, together with the structures of the LED devices, have been observed by scanning transmission electron microscopy. It is shown that dislocation-free nonpolar nitride layers with smooth surfaces can be obtained under growth conditions involving high V/III ratios, which are the optimized growth conditions for c-plane GaN. The peak wavelength of the electroluminescence emission obtained from the finished devices is 435 nm, which is in the blue region. The output power and the calculated external quantum efficiency are 1.79 mW and 3.1%, respectively, at a driving current of 20 mA.