期刊
PHILOSOPHICAL MAGAZINE
卷 86, 期 32, 页码 5009-5016出版社
TAYLOR & FRANCIS LTD
DOI: 10.1080/14786430600746440
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Instrumented indentation and tensile tests were performed on free standing Cu/Ag multilayer thin films with layer thicknesses in the range 0.85 - 900 nm. The effect of layer thickness can be described by a Hall - Petch relationship. The work-hardening rate in the tensile test depends on layer thickness, which indicates that the interfaces create storage sites for dislocations and follows an inverse power law.
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