期刊
ACTA MATERIALIA
卷 54, 期 20, 页码 5551-5557出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2006.08.017
关键词
residual stresses; alumina; piezospectroscopy
Experiments are described in which the R-line luminescence spectra from the thermally grown oxide formed by high temperature oxidation are recorded as a function of uniaxial strain and under different polarization conditions. The data obtained are used to calibrate both the piezospectroscopic effect and the effect of polarization when an external strain is superimposed upon a residual stress field. Although the incident polarization of the light used to excite the luminescence affects the total emission intensity, it does not affect the polarization of the luminescence signal. However, the ratio of the areas of the R2 and R1 luminescence peaks is dependent on both the stress and the orientation of the polarization of the optics used to collect the spectra relative to the applied stress direction. This provides the basis for determining the principal stress directions in a polycrystalline film. No effect of polarization was observed on the frequencies of the R2 and R1 lines. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据