4.4 Article

Synthesis and structural characterization of mesoporous V2O5 thin films for electrochromic applications

期刊

THIN SOLID FILMS
卷 515, 期 4, 页码 1500-1505

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2006.04.029

关键词

vanadium oxide; X-ray diffraction; micro-Raman spectroscopy; scanning electron microscopy

向作者/读者索取更多资源

Mesoporous vanadium pentoxide (V2O5) films have been synthesized by hydrolysis of vanadium tri-isopropoxide (VO(OC3H7)(3)) in the presence of polyethylene glycol (PEG) as a structure-directing agent. The structure, the stoichiometry and the morphology of the films have been studied as a function of the thermal annealing by X-ray diffraction (XRD), micro-Raman spectroscopy, optical microscopy, scanning electron microscopy and atomic force microscopy. XRD patterns and Raman spectra show the presence of two previously unreported crystalline phases. The PEG:V2O5 molar ratio affects the temperature of phase formation, the amount and even the order in which the phases appear. The morphological characterization underlines the role of the surfactant to promote porous networks, formed by micrometric clusters of controlled shapes and patterns embedded in a homogeneous host matrix. (c) 2006 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据