期刊
OPTICS AND LASERS IN ENGINEERING
卷 45, 期 1, 页码 245-248出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.optlaseng.2006.06.003
关键词
silicon; reflectance; Kramer-Kronig
类别
The reflectance of single crystal silicon was carried out at normal angle of incidence in the region from 1 to 5 eV. From these reflectance data, using Kramer-Kronig relations the phase angles between electric fields of incident and reflected waves were calculated. Using the phase angles and Fresnel reflectivity equations, optical constants (n + ik, alpha, epsilon(1)-i epsilon(2),) of silicon were determined. (C) 2006 Elsevier Ltd. All rights reserved.
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