期刊
JOURNAL OF MATERIALS CHEMISTRY
卷 17, 期 15, 页码 1458-1461出版社
ROYAL SOC CHEMISTRY
DOI: 10.1039/b700505a
关键词
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Synchrotron X-ray diffraction from a nominally amorphous molecular semiconductor film reveals both the presence of intermediate-range order (IRO) corresponding to crystalline domains with an average size of a few nanometres, and the growth of these domains upon exposure of the film to moisture.
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