期刊
HCI 2006: 13th International Conference on the Physics of Highly Charged Ions
卷 58, 期 -, 页码 303-306出版社
IOP PUBLISHING LTD
DOI: 10.1088/1742-6596/58/1/067
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A new laboratory for highly charged ions is being built up at Stockholm university. An electron beam ion trap (EBIT) (3T magnet, <= 30 keV electron beam) was installed. It is used for spectroscopic studies, precision mass measurements, electron ion collisions, and highly-charged ion surface studies. Here we report about a fast ion-extraction scheme from EBIT and first results using a time-of-flight detection as well as a LABVIEW based operational system of EBIT.
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