期刊
FERROELECTRICS
卷 357, 期 -, 页码 35-40出版社
TAYLOR & FRANCIS LTD
DOI: 10.1080/00150190701527597
关键词
thin film; sol-gel; raman scattering
Bismuth Ferrite (BFO)films doped with strontium resulting in a nominal composition of Bi1-xSrxFe1O3 (x = 0-0.15) were fabricated using a sol-gel process on Pt/TiO2/SiO2/Si substrates by rapid thermal annealed in air at 700 degrees C. A decrease in the grain size (from 1 mu m to 90 nm) with increasing Sr concentration from 0 to 15% was observed, coupled with the degradation of columnar grain growth. X-ray diffraction and raman scattering showed evidence of a structural change from rhombohedral to pseudocubic with increasing Sr concentration. Leakage measurements revealed that films with Sr acceptor doping showed increased leakage compared to pure BFO, however the film leakage did not increase with increasing acceptor concentration due to microstructural modifications.
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