期刊
OPTICS COMMUNICATIONS
卷 269, 期 2, 页码 346-350出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.optcom.2006.08.034
关键词
ZnO thin films; refractive index; cathodoluminescence
类别
The effects of the thickness variation, substrate type and annealing on the crystallinity parameters, luminescent and optical properties of the zinc oxide (ZnO) thin films were reported. The thin films were deposited on the glass and the amorphous quartz substrates by the standard RF-magnetron sputtering method using ZnO targets in the argon atmosphere. It has been found that the films deposited on the glass substrate manifest a clear size effect. Both the structural and the optical parameters show clearly minima on their thickness dependences. It has been shown that annealing of the comparatively thick ZnO films leads to increase of the crystallite sizes that are followed by a considerable rise of the cathodoluminescence intensity. The corresponding model of the crystallite growth is proposed. (c) 2006 Elsevier B.V. All rights reserved.
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