期刊
SURFACE SCIENCE
卷 601, 期 3, 页码 603-608出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2006.10.026
关键词
overlayers on surfaces; scanning tunneling microscopy; preferential heights in island growth; Ag growth on Si
Growth behavior of thin Ag films on Si substrates at room temperature has been investigated by scanning tunneling microscopy and reflection high energy electron diffraction. In the layer-plus-island growth Ag islands show strongly preferred atomic scale heights and flat top. At low coverage (1 ML), islands containing two atomic layers of Ag are overwhelmingly formed. At higher coverages island height distribution shows strong peaks at relative heights corresponding to an even number (2,4,6....) of Ag atomic layers. Beyond some coverage the height preference vanishes due to the appearance of screw dislocations and spiral growth. (c) 2006 Elsevier B.V. All rights reserved.
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