期刊
PLANT BREEDING
卷 126, 期 1, 页码 13-18出版社
WILEY
DOI: 10.1111/j.1439-0523.2007.01287.x
关键词
Triticum aestivum; T. turgidum; Puccinia triticina; resistance
A set of bread wheat and durum wheat cultivars adapted to Spanish conditions was tested for resistance against leaf rust caused by different pathotypes of Puccinia triticina in field trials and in growth chamber studies. Lower levels of resistance were found in durum wheat than in bread wheat. The most frequent Lr genes found in bread wheat were Lr1, Lr10, Lr13, Lr20, Lr26 and Lr28. In durum wheat, additional resistance genes that differed from the known Lr genes were identified. The level of partial resistance to leaf rust was in general low, although significant levels were identified in some bread wheat and durum wheat cultivars.
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