期刊
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
卷 310, 期 2, 页码 2087-2088出版社
ELSEVIER
DOI: 10.1016/j.jmmm.2006.10.1017
关键词
magnetic semiconductor; ferromagnetism; X-ray diffraction
Growth temperature plays a major role on the magnetic and structural properties of Co-doped ZnO thin films. Ferromagnetism is observed only in films grown at temperatures within a narrow range around 450 degrees C. Metallic Co is detected in 40-300 nm thick films, and the estimated content is compatible with the magnetic moment observed. (c) 2006 Elsevier B.V. All rights reserved.
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