期刊
JOURNAL OF PHYSICS D-APPLIED PHYSICS
卷 40, 期 6, 页码 1655-1658出版社
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/40/6/012
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The carrier effective masses of CaO in the cubic phase are estimated by ab initio calculations, which are used for the simulation of Si/CaO metal-oxide-semiconductor (MOS) devices by solving Schrodinger and Poisson equations self-consistently. The possibility of using CaO as a gate dielectric material for MOS device applications is then discussed. The theoretical simulations point to the possibility of using CaO as a gate dielectric, but thin films of CaO on silicon still present roughness that precludes its actual use as a gate dielectric material.
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