期刊
SCRIPTA MATERIALIA
卷 56, 期 8, 页码 697-700出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2006.12.025
关键词
focused ion beam (FIB) microscopy; crack; grain boundary; precipitates; fatigue
Focused ion beam tomography is a new powerful tool to investigate the three-dimensional (3-D) spreading of microcracks. In this study, the interaction between a fatigue microcrack with a grain boundary decorated by carbide precipitates in a directionally solidified Ni base alloy is investigated. The carbide precipitates strongly influence crack growth by initiating geometrically necessary steps in the crack plane. 3-D reconstruction shows that the sub-surface orientation of grain boundaries is an important factor for interpreting crack growth rate at the surface. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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