A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection. (c) 2006 Elsevier B.V. All rights reserved.