期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 40, 期 -, 页码 S341-S345出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889806048369
关键词
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Phase-separation structures are installed by solution casting and flow of a binary polymer-blend solution of polystyrene and poly-n-butylacrylate in toluene on silicon. Optical microscopy and scanning-probe microscopy measurements provide the surface topography. Large-scale structures are probed with high-resolution or grazing-incidence ultra-small-angle X-ray scattering enabled by high reciprocal-space resolution. Correspondingly, structures of up to 13 mu m are resolved. Local-scale structures are detected with sub-microbeam grazing-incidence small-angle X-ray scattering, providing a high real-space resolution of 1 mm. Nanometre-size cavities are found in the polystyrene-rich parts of the blend film.
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