X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene

The structure of the thin film phase of pentacene was investigated using x-ray diffraction reciprocal space mapping (RSM). The crystal structure was found to be triclinic with the following lattice parameters: a=0.593 nm, b=0.756 nm, c=1.565 nm, alpha=98.6 degrees, beta=93.3 degrees, and gamma=89.8 degrees. Atomic positions were determined by comparing the observed RSM diffraction intensities with theoretical calculations. (C) 2007 American Institute of Physics.