期刊
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL
卷 54, 期 5, 页码 1072-1075出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TUFFC.2007.353
关键词
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This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. Effectiveness is demonstrated through the selective characterization of spurious resonance modes and scattered, nonguided modes appearing in SAW resonators.
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