期刊
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
卷 46, 期 17-19, 页码 L474-L476出版社
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.46.L474
关键词
carbon nanotube; edge conduction; field-effect transistor; contact resistance
We have investigated the current flow path between the nanotube and the contact electrode in carbon nanotube devices using multiprobe devices. The contact and channel resistances have been evaluated by two methods; transmission-line-model technique and four-probe measurement. By comparing the results, we have found that channel resistance evaluated by the four-probe measurement includes contact resistance. This indicates that the widely used four-probe measurement is not applicable to nanotube devices for the evaluation of channel resistance excluding contact resistance. This finding also implies that electron transport between the nanotube and the contact metal occurs at the edge of the contact electrode.
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