期刊
ACTA MATERIALIA
卷 55, 期 10, 页码 3421-3430出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2007.01.049
关键词
X-ray diffraction (XRD); copper; dislocation structure; line broadening; plastic deformation
A novel synchrotron-based technique high angular resolution 3DXRD is presented in detail, and applied to the characterization of oxygen-free, high-conductivity copper at a tensile deformation of 2%. The position and shape in reciprocal space of 14 peaks originating from deeply embedded individual subgrains is reported. From this dataset the density of redundant dislocations in the individual subgrains is inferred to be below 12 x 10(12) m(-2) on average. It is found that the subgrains on average experience a reduction in strain of 0.9 x 10(-4) with respect to the mean elastic strain of the full grain, a rather wide distribution of the strain difference between the subgrains (twice the standard deviation is 2.9 x 10(-4)), and a narrow internal strain distribution (upper limit is 2.4 x 10(-4) full width at half maximum). (C) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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