期刊
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
卷 17, 期 2, 页码 263-266出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TASC.2007.898541
关键词
dielectric losses; kinetic inductance; photon detection; superconducting resonators
We have measured the quality factors and phase noise of niobium and tantalum coplanar waveguide microwave resonators on silicon. The results of both materials are similar. We reach quality factors up to 10(5). At low temperatures the quality factors show an anomalous increase, while the resonance frequency remains constant for increasing power levels. The resonance frequency starts to decrease at temperatures around a tenth of the critical temperature. The phase noise exhibits a 1/f like slope. We attribute this behavior to the silicon dielectric.
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