期刊
ADVANCED MATERIALS
卷 19, 期 12, 页码 1627-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200602467
关键词
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An effective in situ field-emission measurement system, in which the distance between the emitting source and counter electrode can be accurately measured and finely controlled by setting up a second stage inside a scanning electron microscopy chamber, is developed. It is found that nanowires with a density between 60 and 80 mu m(-2) (see figure) and of ca. 1 mu m in length give the highest emitting current density.
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