期刊
出版社
ELSEVIER
DOI: 10.1016/j.nimb.2007.04.290
关键词
x-ray fluorescence; high-resolution crystal spectrometer; chemical effects
In this work our previous study about chemical effects in the K alpha spectra of S compounds employing high-resolution X-ray spectroscopy has been extended to the K beta emission spectra. The measurements were performed with a wavelength dispersive single crystal spectrometer operated in the von Hamos geometry having an energy resolution comparable to the natural linewidth of the measured KP X-ray lines. The target fluorescence was produced by irradiating the samples with the bremsstrahlung from an X-ray tube. The energies and widths of the main components in the KP emission spectrum are given for different sulfur compounds (sulfide, sulfite, sulfate). The measured energy shifts between the K beta lines of the compounds and elemental sulfur are presented as a function of the sulfur oxidation state and compared with the results obtained from the former Ka measurements. (C) 2007 Elsevier B.V. All rights reserved.
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