期刊
SCRIPTA MATERIALIA
卷 57, 期 2, 页码 117-120出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2007.03.032
关键词
multilayer; yield strength; interface; dislocation
The strength of Cu/Au multilayers with different individual layer thicknesses (),) from 25 to 250 nm has been investigated by nanoindentation testing. It is found that the increase in strength of the Cu/Au multilayers with decreasing). follows the Hall-Petch relation until 1 is less than 50 nm. Based on the concept of lattice mismatch, a simple model is proposed to describe interface strengthening ability in metallic multilayers found here and reported in the literature. (C) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据