Spatially Resolved Detection of a Nanometer-Scale Gap by Scanning Electrochemical Microscopy

Nanowires with nanometer-scale gaps are an emerging class of nanomaterials with potential applications in electronics and optics. Here, we demonstrate that the feedback mode of scanning electrochemical microscopy (SECM) allows for spatially resolved detection of a nanogap on the basis of its electrical conductivity. A gapped nanoband is used as a model system to describe a mechanism of a unique feedback effect from a nanogap. Interestingly, both experiments and numerical simulations confirm that a peak current response is obtained when an SECM tip is laterally scanned above an insulating nanogap formed in an unbiased nanoband. On the other hand, no peak current response is expected for a highly conductive nanogap, which must be extremely narrow or filled with highly conductive molecules for efficient electron transport.