期刊
ACTA MATERIALIA
卷 55, 期 14, 页码 4723-4729出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2007.04.040
关键词
carbides; X-ray diffraction (XRD); transmission electron microscopy (TEM); Rietveld refinement
Ta4AlC3, a new member of the M(n+1)AX(n)-phase family, has been synthesized and characterized (n = 1-3; M = early transition metal; A = A-group element; and X = C and/or N). Phase determination by Rietveld refinement of synchrotron X-ray diffraction data shows that Ta4AlC3 belongs to the P6(3)/mmc space group with a and c lattice parameters of 3.10884 +/- 0.00004 angstrom and 24.0776 +/- 0.0004 angstrom, respectively. This is shown to be the alpha-polymorph of Ta4AlC3, with the same structure as Ti4AlN3. Lattice imaging by high-resolution transmission electron microscopy demonstrates the characteristic MAX-phase stacking of alpha-Ta4AlC3. Three modes of mechanical deformation of alpha-Ta4AlC3 are observed: lattice bending, kinking and delamination. (c) 2007 Published by Elsevier Ltd on behalf of Acta Materialia Inc.
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