期刊
REVIEW OF SCIENTIFIC INSTRUMENTS
卷 78, 期 8, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.2754076
关键词
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Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications. (c) 2007 American Institute of Physics.
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