期刊
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
卷 88, 期 3, 页码 527-534出版社
SPRINGER HEIDELBERG
DOI: 10.1007/s00339-007-4068-8
关键词
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Buried interface states in Ar/Cu(100) were studied by means of one- and two-photon photoemission experiments. With increasing Ar overlayer thickness, a transition from broad electron scattering resonances in the Ar conduction band into a hydrogen-like series of quasi-bound states at the Ar/Cu interface was observed. The thickness dependence of energies and lifetimes is compared to theoretical resonance positions and linewidths derived from a parameterized one-dimensional potential.
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