期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 54, 期 8, 页码 1838-1842出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2007.901349
关键词
FETs; gallium compounds; pseudomorphic-HEMTs (p-HEMTs); Raman spectroscopy; temperature
资金
- Engineering and Physical Sciences Research Council [GR/S76182/01] Funding Source: researchfish
Self-heating in multifinger GaAs pseudomorphic-HEMT devices was investigated by micro-Raman spectroscopy. The device temperature was probed on the die as a function of applied bias, external heating, and device geometry. The temperature of the top GaAs layer was recorded inside the source-drain gap, as well as on the device periphery using 488-nm laser excitation. Obtained Raman temperatures were found to be higher than infrared thermography results, which is due to the improved-spatial resolution of micro-Raman spectroscopy. Thermal resistance and crosstalk in the multifinger devices was evaluated as a function of thermal stress and finger pitch.
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