期刊
OPTICS EXPRESS
卷 15, 期 17, 页码 10744-10752出版社
OPTICAL SOC AMER
DOI: 10.1364/OE.15.010744
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We show that the optical properties of thin metallic films depend on the thickness of the film as well as on the deposition technique. Several thicknesses of electron-beam-gun-evaporated aluminium films were measured and the refractive index and the extinction coefficient defined using ellipsometry. In addition, the refractive indexes and the extinction coefficients of atomic-layer-deposited iridium were compared with those of evaporated iridium samples. (c) 2007 Optical Society of America
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