期刊
ACTA MATERIALIA
卷 55, 期 15, 页码 5157-5167出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2007.05.045
关键词
deformation structure; EBSD; interfaces; nickel; recrystallization
By combining a focused ion beam (FIB) microscope with a field emission gun scanning electron microscope, it is possible to sequentially mill away similar to 50 nm sections of a material by FIB and characterize, at high resolution, the crystallographic features of each new surface by electron backscatter diffraction (EBSD). The successive EBSD maps are subsequently combined to generate three-dimensional crystallographic maps of the microstructure. FIB-EBSD tomography was used to investigate the deformation and recrystallization behaviour of a nickel alloy containing coarse silica particles. The technique demonstrated unambiguously the influence of particle diameter on the misorientations generated within particle deformation zones and showed that particle-stimulated nucleation (PSN) of recrystallization occurred at particles greater than similar to 1 mu m. PSN also often generated groups of contiguous grains separated by both coherent and incoherent twin boundaries. It was found that much of the behaviour observed using FIB-EBSD tomography is not clearly evident in two-dimensional EBSD micrographs. (C) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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