期刊
ULTRAMICROSCOPY
卷 107, 期 9, 页码 756-760出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2007.02.024
关键词
atom probe; specimen preparation; focused ion beam
类别
A dual FIB/SEM provides solutions to many challenges in atom probe specimen preparation. When combined with an in situ lift-out capability, the versatility of this tool allows almost any region of interest, in almost any geometry, to be placed at the apex of a specimen tip. Several preparation techniques have been developed in response to specific application requirements; for example, in cases where materials are not suitable for electropolishing, or where site-specific analysis is required. Two general techniques, with wide-ranging potential applications, are described in detail here. The first is a 'cut-out' technique that provides a relatively quick means of micro-tip specimen preparation from bulk material samples. The second method is a 'lift-out' technique that can be used in an in situ or ex situ mode and does not require the preparation of pre-sharpened mounting points. (c) 2007 Elsevier B.V. All rights reserved.
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