Probing local electronic transport at the organic single-crystal/dielectric interface

We demonstrate that scanning Kelvin probe microscopy (SKPM), an atomic force microscopy (AFM)-based potentiometric technique, allows for an in-depth exploration of the local electrical potential at the organic/dielectric interface in sub-pm thick organic single crystals (OSCs), opening novel perspectives for a deeper understanding of intrinsic charge transport, interfacial and contact effects in semiconducting organic single crystals.