期刊
APPLIED SURFACE SCIENCE
卷 253, 期 23, 页码 9159-9163出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2007.05.058
关键词
field emission; doped semiconductor; field enhancement factor; SnO2; RuO2
Field emission studies of a bunch and a single isolated RuO2:SnO2 wire have been performed. A current density of 5.73 x 10(4) A/cm(2) is drawn from the single wire emitter at an applied field of 8.46 x 10(4) V/mu m. Nonlinearity in the Fowler-Nordheim (F-N) plot has been observed and explained on the basis of electron emission from both the conduction and the valence bands of the semiconductor. The current stability recorded at the preset value of 1.5 LA is observed to be good. Overall the high emission current density, good stability and mechanically robust nature of the RuO2:SnO2 wires offer advantages as field emitters for many potential applications. (c) 2007 Elsevier B.V. All rights reserved.
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